DTSX-400-760

1-axis Deflector TeO2 [S], Rise/fall time 1µs/mm, Aperture 7.5 x 7.5 mm², Wavelength 760 nm, RF power<2W.

Description

This 1-axis high resolution deflector operates at 760 nm with Te02 shear mode. It offers large scan angles, high resolutions and large aperture of 7.5 x 7.5 mm. Associated to the appropriate RF driver, this AOD provides high precision and accuracy which is required for most application such as optical tweezers, biomedical diagnostics and many others.

Datasheet (DTSxx-d024)

Additional information

Wavelength (nm)

759

Version axis

1-axis

Aperture/mm²

7.5×7.5

Resolution TDF

332

Scan angle (mrad/mrad²)

42

Min Efficiency

70 %

Associated RF drivers